Characterization of the electrical properties of MPS schottky structures incorporating Fe doped polyvinyl chloride (PVC)

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dc.authorid0000-0001-7723-4188en_US
dc.contributor.authorBadali, Yosef
dc.date.accessioned2024-03-26T08:16:15Z
dc.date.available2024-03-26T08:16:15Z
dc.date.issued2024en_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.description.abstractThis paper explores the effects of the organic interfacial layer on the electrophysical characteristics of Schottky barrier diodes (SBDs). Three types of SBDs were fabricated: Au-Si (referred to as MS), Au/PVC/Si (referred to as MPS1), and Au-/PVC:Fe/Si (referred to as MPS2). Fe nanopowders were subjected to analysis using XRD, SEM, and EDX techniques to investigate their structural and optical characteristics. To investigate the conduction mechanisms of these diodes, I-V characteristics were examined using thermionic-emission (TE), Cheung, and Norde functions. The surface-state density (N ss ) distribution of energy was determined by analyzing the current-voltage (IF-VF) curve under forward bias conditions. This analysis considered the voltage-dependent barrier height (BH) and ideality factor (n(V)). The results demonstrated that the polymeric interlayer without Fe nanoparticles reduced N ss by a factor of 7, while the presence of Fe nanoparticles led to a two-order magnitude decrease, resulting in improved efficiency in comparison with MS structures. The obtained results indicated that including a polymeric layer in MPS structure enhanced their electrophysical features compared to MS diodes, and significantly increased rectification by 15-45 times. In summary, the existence of an organic interfacial layer significantly altered the conduction mechanisms and electrophysical characteristics of MPS diodes. It was found that the addition of Fe nanoparticles in the interlayer resulted in substantial improvements in N ss , efficiency, rectification, and conduction characteristics compared to MS diodes.en_US
dc.identifier.doi10.1088/1402-4896/ad1453en_US
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85181010732en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.urihttps://hdl.handle.net/11467/7188
dc.identifier.urihttps://doi.org/10.1088/1402-4896/ad1453
dc.identifier.volume99en_US
dc.identifier.wosWOS:001130267400001en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherInstitute of Physicsen_US
dc.relation.ispartofPhysica Scriptaen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/restrictedAccessen_US
dc.subject(PVC: Fe) interlayer; electrical parameters; MPS Schottky diodes; Poole-Frenkel mechanisms; Schottky emission (PFE, SE); surface-stateen_US
dc.titleCharacterization of the electrical properties of MPS schottky structures incorporating Fe doped polyvinyl chloride (PVC)en_US
dc.typeArticleen_US

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