Case study of a radiated susceptibility problem leading to a TVS diode thermal runaway
| dc.contributor.author | Üstüner, Fatih | |
| dc.contributor.author | Demirel, Ekrem | |
| dc.contributor.author | Çitkaya, A. Yasin | |
| dc.contributor.author | Mersin, Mücahid T. | |
| dc.contributor.author | Çoşar, Çoşkun | |
| dc.date.accessioned | 2021-11-09T10:14:21Z | |
| dc.date.available | 2021-11-09T10:14:21Z | |
| dc.date.issued | 2021 | en_US |
| dc.department | Fakülteler, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümü | en_US |
| dc.description.abstract | During the radiated susceptibility test of an equipment, the thermal runaway of a circuit element (TVS diode) is observed. In this work, the case is systematically investigated to understand how this physical hazard has occurred. By modeling and simulation, the parametric analysis of the induced voltage on the TVS diode has been carried out. Possible solutions are proposed and analyzed. The capacitive filtering solution proves itself both in terms of performance and application easiness point of view. | en_US |
| dc.identifier.doi | 10.23919/URSIGASS51995.2021.9560233 | en_US |
| dc.identifier.scopus | 2-s2.0-85118234919 | en_US |
| dc.identifier.scopusquality | N/A | en_US |
| dc.identifier.uri | https://hdl.handle.net/11467/5085 | |
| dc.identifier.uri | https://doi.org/10.23919/URSIGASS51995.2021.9560233 | |
| dc.indekslendigikaynak | Scopus | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.ispartof | 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021 | en_US |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/embargoedAccess | en_US |
| dc.title | Case study of a radiated susceptibility problem leading to a TVS diode thermal runaway | en_US |
| dc.type | Conference Object | en_US |
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