Case study of a radiated susceptibility problem leading to a TVS diode thermal runaway
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Tarih
2021
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Dergi ISSN
Cilt Başlığı
Yayıncı
IEEE
Erişim Hakkı
info:eu-repo/semantics/embargoedAccess
Özet
During the radiated susceptibility test of an equipment, the thermal runaway of a circuit element (TVS diode) is observed. In this work, the case is systematically investigated to understand how this physical hazard has occurred. By modeling and simulation, the parametric analysis of the induced voltage on the TVS diode has been carried out. Possible solutions are proposed and analyzed. The capacitive filtering solution proves itself both in terms of performance and application easiness point of view.
Açıklama
Anahtar Kelimeler
Kaynak
34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
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Scopus Q Değeri
N/A
