Üstüner, FatihDemirel, EkremÇitkaya, A. YasinMersin, Mücahid T.Çoşar, Çoşkun2021-11-092021-11-092021https://hdl.handle.net/11467/5085https://doi.org/10.23919/URSIGASS51995.2021.9560233During the radiated susceptibility test of an equipment, the thermal runaway of a circuit element (TVS diode) is observed. In this work, the case is systematically investigated to understand how this physical hazard has occurred. By modeling and simulation, the parametric analysis of the induced voltage on the TVS diode has been carried out. Possible solutions are proposed and analyzed. The capacitive filtering solution proves itself both in terms of performance and application easiness point of view.eninfo:eu-repo/semantics/embargoedAccessConference ObjectN/A2-s2.0-8511823491910.23919/URSIGASS51995.2021.9560233